Benchtop Total Reflection X-ray Fluorescence Spectrometer, Nanohunter

Winner of the 2007 R&D 100 award, a mark of excellence known to industry, government, and academia as proof that the winner is one of the most innovative products of the year, the Rigaku NANOHUNTER benchtop total reflection X-ray fluorescence (TXRF) spectrometer was specifically designed to offer comprehensive trace element and materials characterization analysis capabilities to a broader range of research disciplines, and in more diverse analytical settings, than was possible with previous technology. Whether for geologists, chemists, biochemists, biologists, materials scientists and engineers, non-destructive trace element analysis is attainable, with minimal to no sample preparation, for applications that span from metallo-protein research to environmental assessment and semiconductor wafer metrology.

Unique variable incidence angle for depth profiling

Providing both trace-level elemental analysis and evaluation of the physical nature of the sample, NANOHUNTER uses a patented switchable wavelength and automated variable X-ray incidence angle excitation design. The instrument can analyze the full range of elements, from aluminum (Al) to uranium (U), in solids, liquids, and powders. It also provides chemical information as a function of analysis depth for profiling surface characteristics of materials. As an example, for researchers involved in nano-technology, this ability allows surface layers to be characterized as a residue on a substrate, a homogenous thin film, or as something in between.

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